Tracewell Systems

Features

• Patented open-frame design eliminates extender boards
  
• Voltage, current and temperature monitoring
  
• Margin control for +5 and +3.3 volt outputs
  
• Hot-swap compatible per PICMG 2.1
  
• 350 watt, N+1, or 700 watt operation
  
• Plugging power supplies with PFC and hot-swap
  
• IEEE 1101.10/11 compliant steel sub-racks eliminate flex
  
• Adjustable rear card cage for 60, 80, and 100mm boards

The T-Frame™ for CompactPCI is a versatile 8-slot bench top system combining unique design and features; creating the ideal platform for board-level and software development, manufacturing and testing.

T-Frame’s patented open-frame design provides unrestricted access to installed boards, eliminating the need for performance-robbing extender cards. The T-Frame ™ includes comprehensive monitoring of all backplane voltages, current and exhaust air temperature. The front panel interface displays these monitor outputs and includes temperature, fan speed, and voltage control, including +5 and +3.3 volt margining. The 8- slot 64-bit backplane is hot-swap compatible and supports standard 3U or 6U boards. System slot is left justified to provide full access to the component side of installed boards. Two power options are available including single or dual 350 watt plugging power supplies, allowing hot-swap power simulation, N+1, or 700 watt operation. Power supplies may be installed in either the front or rear card cage, further improving accessibility. Fans are adjustable to full or half speed and automatically turn-off when not in use to reduce noise. T-Frame’s steel and aluminum construction make it rugged yet easily portable. Tracewell’s rigid steel card cage eliminates the flex common to conventional extruded rail designs and is fully IEEE 1101.10/11 compliant. The rear I/O card cage is adjustable for a wide range of board depths. Other conveniences include a tilt base, removable side access covers, recessed carrying handles, and internal 3.5" peripheral bay.

T-Frame™ for CompactPCI solves the problem of accessibility, measurement and control during development, thereby reducing design cycles and time-to-market.